Assignee
TOPCON CORP
JP·1,294 granted patents·283 pending applications·16,935 citations·filing 1987–2025
Top patents by PatentIndex Score
1,577 records- 0198US11257190B2Image quality improvement methods for optical coherence tomographyTOPCON CORP·Filed 2020·Granted Feb 22, 2022·31 cites·13 claims
- 0298US9201422B2Measuring systemTOPCON CORP·Filed 2015·Granted Dec 1, 2015·43 cites·6 claims
- 0397US11966508B2Survey systemTOPCON CORP·Filed 2022·Granted Apr 23, 2024·6 cites·6 claims
- 0497US11313680B2Positioning device, positioning method, and programTOPCON CORP·Filed 2020·Granted Apr 26, 2022·6 cites·5 claims
- 0597US7649920B2Q-switched microlaser apparatus and method for useTOPCON CORP·Filed 2007·Granted Jan 19, 2010·100 cites·25 claims
- 0696US11933611B2Target direction determining device, control system, and method and program for aiming surveying device at a targetTOPCON CORP·Filed 2021·Granted Mar 19, 2024·4 cites·6 claims
- 0796US11403826B2Management system and management method using eyewear deviceTOPCON CORP·Filed 2020·Granted Aug 2, 2022·4 cites·8 claims
- 0896US9053547B2Three-dimensional point cloud position data processing device, three-dimensional point cloud position data processing system, and three-dimensional point cloud position data processing method and programTOPCON CORP·Filed 2013·Granted Jun 9, 2015·34 cites·15 claims
- 0996US8045762B2Surveying method, surveying system and surveying data processing programTOPCON CORP·Filed 2007·Granted Oct 25, 2011·63 cites·18 claims
- 1096US7747151B2Image processing device and methodTOPCON CORP·Filed 2007·Granted Jun 29, 2010·54 cites·15 claims
- 1196USD552736SOphthalmic instrumentTOPCON CORP·Filed 2006·Granted Oct 9, 2007·105 cites·1 claims
- 1295US12152883B2Three-dimensional position measuring system, measuring method, and storage mediumTOPCON CORP·Filed 2022·Granted Nov 26, 2024·4 cites·8 claims
- 1395US11402506B2Laser measuring method and laser measuring instrumentTOPCON CORP·Filed 2018·Granted Aug 2, 2022·14 cites·14 claims
- 1495US11393169B2Photogrammetry of building using machine learning based inferenceTOPCON CORP·Filed 2021·Granted Jul 19, 2022·4 cites·30 claims
- 1595US10895456B1Three-dimensional survey apparatus, three-dimensional survey method, and three-dimensional survey programTOPCON CORP·Filed 2020·Granted Jan 19, 2021·6 cites·5 claims
- 1695US10478060B2Ophthalmic image processing apparatus and ophthalmic imaging apparatusTOPCON CORP·Filed 2017·Granted Nov 19, 2019·18 cites·10 claims
- 1795US7604351B2Optical image measurement device and optical image measurement methodTOPCON CORP·Filed 2008·Granted Oct 20, 2009·33 cites·17 claims
- 1895US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 1995US7319512B2Surveying instrumentTOPCON CORP·Filed 2005·Granted Jan 15, 2008·52 cites·8 claims
- 2095US5771978AGrading implement elevation controller with tracking station and reference laser beamTOPCON CORP·Filed 1996·Granted Jun 30, 1998·104 cites·21 claims
- 2195US2026069140A1Ophthalmic observation apparatusTOPCON CORP·Filed 2025·Application pending·0 cites
- 2294US12152880B2Surveying system, point cloud data acquiring method, and point cloud data acquiring programTOPCON CORP·Filed 2022·Granted Nov 26, 2024·2 cites·22 claims
- 2394US11536568B2Target instrument and surveying systemTOPCON CORP·Filed 2019·Granted Dec 27, 2022·11 cites·8 claims
- 2494US9897436B2Measuring instrument and surveying systemTOPCON CORP·Filed 2017·Granted Feb 20, 2018·8 cites·25 claims
- 2594US7474388B2Distance measuring deviceTOPCON CORP·Filed 2006·Granted Jan 6, 2009·76 cites·9 claims
- 2694US7345770B2Optical image measuring apparatus and optical image measuring method for forming a velocity distribution image expressing a moving velocity distribution of the moving matterTOPCON CORP·Filed 2005·Granted Mar 18, 2008·41 cites·50 claims
- 2794US7130035B2Target for surveying instrumentTOPCON CORP·Filed 2005·Granted Oct 31, 2006·44 cites·11 claims
- 2894US5485266ALaser beam survey instrument having a tiltable laser beam axis and tilt detectorsTOPCON CORP·Filed 1993·Granted Jan 16, 1996·130 cites·7 claims
- 2993US11808571B2Surveying system, staking assistance method, and storage medium storing staking assistance programTOPCON CORP·Filed 2021·Granted Nov 7, 2023·5 cites·6 claims
- 3093US11614415B2Nondestructive testing system and nondestructive testing methodTOPCON CORP·Filed 2020·Granted Mar 28, 2023·5 cites·20 claims
- 3193US11592291B2Method, device, and program for surveyingTOPCON CORP·Filed 2019·Granted Feb 28, 2023·10 cites·7 claims
- 3293US11132797B2Automatically identifying regions of interest of an object from horizontal images using a machine learning guided imaging systemTOPCON CORP·Filed 2018·Granted Sep 28, 2021·15 cites·17 claims
- 3393US9369697B2Measuring instrument for preparing three-dimensional point cloud modelTOPCON CORP·Filed 2014·Granted Jun 14, 2016·22 cites·7 claims
- 3493US7804996B2Method for associating stereo image and three-dimensional data preparation systemTOPCON CORP·Filed 2005·Granted Sep 28, 2010·41 cites·15 claims
- 3593US7626690B2Laser scannerTOPCON CORP·Filed 2007·Granted Dec 1, 2009·45 cites·8 claims
- 3693US7492466B2Optical image measuring apparatus and optical image measuring methodTOPCON CORP·Filed 2005·Granted Feb 17, 2009·35 cites·71 claims
- 3793USD585903SUser interface for ophthalmic instrumentTOPCON CORP·Filed 2006·Granted Feb 3, 2009·61 cites·1 claims
- 3893US7329867B2Electron beam system and electron beam measuring and observing methodsTOPCON CORP·Filed 2006·Granted Feb 12, 2008·20 cites·10 claims
- 3993US6852974B2Electron beam device and method for stereoscopic measurementsTOPCON CORP·Filed 2002·Granted Feb 8, 2005·40 cites·19 claims
- 4093US5226910ASurgical cutterTOPCON CORP·Filed 1992·Granted Jul 13, 1993·696 cites·3 claims
- 4192US10809360B2Laser scannerTOPCON CORP·Filed 2018·Granted Oct 20, 2020·9 cites·18 claims
- 4292US9073637B2Flying vehicle guiding system and flying vehicle guiding methodTOPCON CORP·Filed 2014·Granted Jul 7, 2015·19 cites·12 claims
- 4392US7860273B2Device and method for position measurementTOPCON CORP·Filed 2007·Granted Dec 28, 2010·36 cites·40 claims
- 4492US7844077B2Location measuring device and methodTOPCON CORP·Filed 2008·Granted Nov 30, 2010·25 cites·8 claims
- 4592US7206080B2Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatusTOPCON CORP·Filed 2002·Granted Apr 17, 2007·60 cites·12 claims
- 4692US5973772ALayout judgment apparatus and layout judgment systemTOPCON CORP·Filed 1997·Granted Oct 26, 1999·66 cites·17 claims
- 4791US11871994B2Ophthalmologic microscope and function expansion unitTOPCON CORP·Filed 2021·Granted Jan 16, 2024·2 cites·8 claims
- 4891US10520307B2Surveying instrumentTOPCON CORP·Filed 2017·Granted Dec 31, 2019·10 cites·7 claims
- 4991US7756311B2Optical image measuring device, optical image measuring program, fundus observation device, and fundus observation programTOPCON CORP·Filed 2006·Granted Jul 13, 2010·21 cites·32 claims
- 5091US7701566B2Surveying systemTOPCON CORP·Filed 2008·Granted Apr 20, 2010·31 cites·6 claims
Showing the top 50 of 1,577 patent records by PatentIndex Score.
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →