Assignee
TOPOMETRIX CORP
US·7 granted patents·473 citations·filing 1991–1996
Top patents by PatentIndex Score
7 records- 0195US5441343AThermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimenTOPOMETRIX CORP·Filed 1993·Granted Aug 15, 1995·183 cites·9 claims
- 0293US5406832ASynchronous sampling scanning force microscopeTOPOMETRIX CORP·Filed 1993·Granted Apr 18, 1995·77 cites·57 claims
- 0387US5510615AScanning probe microscope apparatus for use in a scanning electron microscopeTOPOMETRIX CORP·Filed 1995·Granted Apr 23, 1996·107 cites·24 claims
- 0477US5260622AHigh resolution electromechanical translation deviceTOPOMETRIX CORP·Filed 1991·Granted Nov 9, 1993·34 cites·7 claims
- 0573US5481908AResonance contact scanning force microscopeTOPOMETRIX CORP·Filed 1993·Granted Jan 9, 1996·28 cites·17 claims
- 0660US5625142AResonance contact scanning force microscopeTOPOMETRIX CORP·Filed 1995·Granted Apr 29, 1997·21 cites·10 claims
- 0759US5681987AResonance contact scanning force microscopeTOPOMETRIX CORP·Filed 1996·Granted Oct 28, 1997·23 cites·9 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →