Assignee
TOPOMETRIX CORP
US7 patents
Top patents by PatentIndex Score
US5510615AApr 23, 1996
Scanning probe microscope apparatus for use in a scanning electron microscope
TOPOMETRIX CORP107 citations95
US5441343AAug 15, 1995
Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen
TOPOMETRIX CORP183 citations95
US5406832AApr 18, 1995
Synchronous sampling scanning force microscope
TOPOMETRIX CORP77 citations95
US5681987AOct 28, 1997
Resonance contact scanning force microscope
TOPOMETRIX CORP23 citations92
US5625142AApr 29, 1997
Resonance contact scanning force microscope
TOPOMETRIX CORP21 citations92
US5481908AJan 9, 1996
Resonance contact scanning force microscope
TOPOMETRIX CORP28 citations92
US5260622ANov 9, 1993
High resolution electromechanical translation device
TOPOMETRIX CORP34 citations92