Assignee
TORAYA HIDEO
JP·3 granted patents·22 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0188US8340248B2X-ray diffraction method and X-ray diffraction apparatusTORAYA HIDEO·Filed 2010·Granted Dec 25, 2012·16 cites·6 claims
- 0273US9146203B2X-ray stress measuring apparatusTORAYA HIDEO·Filed 2011·Granted Sep 29, 2015·6 cites·12 claims
- 0340US9417195B2Method and its apparatus for x-ray diffractionTORAYA HIDEO·Filed 2011·Granted Aug 16, 2016·0 cites·18 claims
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