Assignee
TOYODA YASUTAKA
JP·7 granted patents·2 pending applications·26 citations·filing 2009–2012
Top patents by PatentIndex Score
9 records- 0184US8217351B2Pattern inspection method and pattern inspection systemTOYODA YASUTAKA·Filed 2010·Granted Jul 10, 2012·6 cites·6 claims
- 0284US8077962B2Pattern generating apparatus and pattern shape evaluating apparatusTOYODA YASUTAKA·Filed 2009·Granted Dec 13, 2011·9 cites·44 claims
- 0382US8577124B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2012·Granted Nov 5, 2013·5 cites·10 claims
- 0478US8115169B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2009·Granted Feb 14, 2012·3 cites·7 claims
- 0574US8653456B2Pattern inspection method, pattern inspection program, and electronic device inspection systemTOYODA YASUTAKA·Filed 2011·Granted Feb 18, 2014·3 cites·18 claims
- 0645US9183622B2Image processing apparatusTOYODA YASUTAKA·Filed 2011·Granted Nov 10, 2015·0 cites·25 claims
- 0741US2012182415A1Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing ApparatusTOYODA YASUTAKA·Filed 2010·Application pending·0 cites
- 0838US8977034B2Pattern shape evaluation method and pattern shape evaluation apparatusTOYODA YASUTAKA·Filed 2010·Granted Mar 10, 2015·0 cites·13 claims
- 0938US2012290990A1Pattern Measuring Condition Setting DeviceTOYODA YASUTAKA·Filed 2010·Application pending·0 cites
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