Assignee
TRUPKE THORSTEN
AU6 patents
Top patents by PatentIndex Score
US8742372B2Jun 3, 2014
Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
TRUPKE THORSTEN5 citations82
US8710860B2Apr 29, 2014
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
TRUPKE THORSTEN8 citations82
US8064054B2Nov 22, 2011
Method and system for inspecting indirect bandgap semiconductor structure
TRUPKE THORSTEN11 citations82
US9234849B2Jan 12, 2016
Method and system for inspecting indirect bandgap semiconductor structure
TRUPKE THORSTEN1 citations60
US8218140B2Jul 10, 2012
Method and system for inspecting indirect bandgap semiconductor stucture
TRUPKE THORSTEN1 citations60
US9103792B2Aug 11, 2015
Wafer imaging and processing method and apparatus
TRUPKE THORSTEN3 citations58