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TSEN ANDY
TW4 patents
Top patents by PatentIndex Score
US8108060B2Jan 31, 2012
System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture
TSEN ANDY25 citations90
US8229588B2Jul 24, 2012
Method and system for tuning advanced process control parameters
TSEN ANDY32 citations89
US8394719B2Mar 12, 2013
System and method for implementing multi-resolution advanced process control
TSEN ANDY9 citations80
US8219341B2Jul 10, 2012
System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model
TSEN ANDY2 citations60