Assignee
TSENG NAN-HSIN
TW·5 granted patents·11 citations·filing 2010–2011
Top patents by PatentIndex Score
5 records- 0186US8113412B1Methods for detecting defect connections between metal bumpsTSENG NAN-HSIN·Filed 2011·Granted Feb 14, 2012·7 cites·20 claims
- 0267US8614571B2Apparatus and method for on-chip sampling of dynamic IR voltage dropTSENG NAN-HSIN·Filed 2011·Granted Dec 24, 2013·2 cites·18 claims
- 0365US8680882B23D-IC interposer testing structure and method of testing the structureTSENG NAN-HSIN·Filed 2011·Granted Mar 25, 2014·2 cites·13 claims
- 0452US8305847B2Ultra high resolution timing measurementTSENG NAN-HSIN·Filed 2011·Granted Nov 6, 2012·0 cites·20 claims
- 0536US8339155B2System and method for detecting soft-failsTSENG NAN-HSIN·Filed 2010·Granted Dec 25, 2012·0 cites·20 claims
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