Assignee
TSUCHIYA HIDEO
JP·4 granted patents·19 citations·filing 2010–2011
Top patents by PatentIndex Score
4 records- 0191US8737676B2Defect estimation device and method and inspection system and methodTSUCHIYA HIDEO·Filed 2011·Granted May 27, 2014·13 cites·2 claims
- 0283US8903158B2Inspection system and inspection methodTSUCHIYA HIDEO·Filed 2010·Granted Dec 2, 2014·5 cites·16 claims
- 0367US9057711B2Inspection apparatus and methodTSUCHIYA HIDEO·Filed 2011·Granted Jun 16, 2015·1 cites·6 claims
- 0437US9031313B2Inspection systemTSUCHIYA HIDEO·Filed 2010·Granted May 12, 2015·0 cites·6 claims
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