Assignee
TSUNETA RURIKO
JP·2 granted patents·1 pending application·12 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0181US8993961B2Electric charged particle beam microscope and electric charged particle beam microscopyTSUNETA RURIKO·Filed 2011·Granted Mar 31, 2015·6 cites·10 claims
- 0268US8442300B2Specified position identifying method and specified position measuring apparatusTSUNETA RURIKO·Filed 2007·Granted May 14, 2013·6 cites·9 claims
- 0335US2012104253A1Charged particle beam microscope and measuring method using sameTSUNETA RURIKO·Filed 2010·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →