Assignee
TU AN-CHUN
TW·3 granted patents·8 citations·filing 2009–2014
Top patents by PatentIndex Score
3 records- 0184US8704224B2Semiconductor test structuresTU AN-CHUN·Filed 2011·Granted Apr 22, 2014·5 cites·13 claims
- 0265US8614131B2Self-aligned static random access memory (SRAM) on metal gateTU AN-CHUN·Filed 2009·Granted Dec 24, 2013·3 cites·20 claims
- 0356US9377503B2Semiconductor test structuresTU AN-CHUN·Filed 2014·Granted Jun 28, 2016·0 cites·20 claims
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