Assignee
UENO TAKETO
JP·3 granted patents·9 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0184US8660336B2Defect inspection systemUENO TAKETO·Filed 2012·Granted Feb 25, 2014·5 cites·16 claims
- 0272US8275189B2Defect inspection systemUENO TAKETO·Filed 2010·Granted Sep 25, 2012·2 cites·8 claims
- 0362US9182592B2Optical filtering device, defect inspection method and apparatus thereforUENO TAKETO·Filed 2012·Granted Nov 10, 2015·2 cites·11 claims
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