Assignee

UMCI LTD

SG·2 granted patents·62 citations·filing 2005–2005

Technology mixG01N1 H10P1

Top patents by PatentIndex Score

2 records

0190US7402801B2Inspecting method of a defect inspection deviceUMCI LTD·Filed 2005·Granted Jul 22, 2008·57 cites·5 claims
0272US7142940B2Method of processing semiconductor waferUMCI LTD·Filed 2005·Granted Nov 28, 2006·5 cites·20 claims

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