Assignee
UMEMURA YOSHIHARU
JP·3 granted patents·9 citations·filing 2009–2010
Top patents by PatentIndex Score
3 records- 0175US8410807B2Test system and probe apparatusUMEMURA YOSHIHARU·Filed 2010·Granted Apr 2, 2013·4 cites·12 claims
- 0263US8779791B2Method of manufacturing probe having boards connected by magnetsUMEMURA YOSHIHARU·Filed 2010·Granted Jul 15, 2014·2 cites·6 claims
- 0357US8598902B2Probe, electronic device test apparatus, and method of producing the sameUMEMURA YOSHIHARU·Filed 2009·Granted Dec 3, 2013·3 cites·28 claims
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