Assignee
UNITEST INC
KR·26 granted patents·8 pending applications·90 citations·filing 2002–2025
Top patents by PatentIndex Score
34 records- 0178US7459399B2Method for manufacturing probe structure of probe cardUNITEST INC·Filed 2007·Granted Dec 2, 2008·6 cites·13 claims
- 0277US7302623B2Algorithm pattern generator for testing a memory device and memory tester using the sameUNITEST INC·Filed 2005·Granted Nov 27, 2007·12 cites·17 claims
- 0376US9171643B2Solid state drive testerUNITEST INC·Filed 2013·Granted Oct 27, 2015·5 cites·8 claims
- 0475US7872488B2Tester for testing semiconductor deviceUNITEST INC·Filed 2007·Granted Jan 18, 2011·5 cites·7 claims
- 0574US7285967B2Probe card having deeply recessed trench and method for manufacturing the sameUNITEST INC·Filed 2005·Granted Oct 23, 2007·7 cites·11 claims
- 0672US9411700B2Storage tester capable of individual control for a plurality of storageUNITEST INC·Filed 2014·Granted Aug 9, 2016·4 cites·7 claims
- 0771US7739572B2Tester for testing semiconductor deviceUNITEST INC·Filed 2007·Granted Jun 15, 2010·4 cites·13 claims
- 0869US9159454B2Failure detection apparatus for solid state drive testerUNITEST INC·Filed 2013·Granted Oct 13, 2015·3 cites·8 claims
- 0967US9153345B2Error generating apparatus for solid state drive testerUNITEST INC·Filed 2013·Granted Oct 6, 2015·4 cites·7 claims
- 1065US6883128B2PC and ATE integrated chip test equipmentUNITEST INC·Filed 2002·Granted Apr 19, 2005·12 cites·4 claims
- 1164US7656178B2Method for calibrating semiconductor device testerUNITEST INC·Filed 2007·Granted Feb 2, 2010·2 cites·11 claims
- 1264US7327151B2Memory application tester having vertically-mounted motherboardUNITEST INC·Filed 2005·Granted Feb 5, 2008·6 cites·14 claims
- 1363US7652497B2Sequential semiconductor device testerUNITEST INC·Filed 2007·Granted Jan 26, 2010·2 cites·14 claims
- 1462US2025266634A1Electrical connector for supplying utilityUNITEST INC·Filed 2024·Application pending·0 cites
- 1560US9245613B2Storage interface apparatus for solid state drive testerUNITEST INC·Filed 2013·Granted Jan 26, 2016·1 cites·5 claims
- 1660US7288949B2Semiconductor test interfaceUNITEST INC·Filed 2006·Granted Oct 30, 2007·5 cites·1 claims
- 1759US7607056B2Semiconductor test apparatus for simultaneously testing plurality of semiconductor devicesUNITEST INC·Filed 2005·Granted Oct 20, 2009·4 cites·6 claims
- 1859US2025264176A1Automatic connector for supplying utilityUNITEST INC·Filed 2024·Application pending·0 cites
- 1957US2025277845A1Test board for burn-in testUNITEST INC·Filed 2025·Application pending·0 cites
- 2053US9459302B2Device under test tester using redriverUNITEST INC·Filed 2013·Granted Oct 4, 2016·2 cites·5 claims
- 2153US7688099B2Sequential semiconductor device testerUNITEST INC·Filed 2007·Granted Mar 30, 2010·3 cites·10 claims
- 2253US2025251443A1Cartridge module and multi wafer burn-in test device utilizing sameUNITEST INC·Filed 2024·Application pending·0 cites
- 2345US7875193B2Method for manufacturing probe structure of probe cardUNITEST INC·Filed 2007·Granted Jan 25, 2011·0 cites·4 claims
- 2443US2008040639A1Apparatus and Method For Generating Test Pattern Data For Testing Semiconductor DeviceUNITEST INC·Filed 2007·Application pending·0 cites
- 2543US2008034265A1Tester For Testing Semiconductor DeviceUNITEST INC·Filed 2007·Application pending·0 cites
- 2643US2024023351A1Perovskite solar cell module and manufacturing method for sameUNITEST INC·Filed 2021·Application pending·0 cites
- 2742US9312030B2Apparatus and method for acquiring data of fast fail memoryUNITEST INC·Filed 2014·Granted Apr 12, 2016·0 cites·5 claims
- 2840US9378846B2Non-mounted storage test device based on FPGAUNITEST INC·Filed 2014·Granted Jun 28, 2016·3 cites·8 claims
- 2939US9015545B2Solid state drive testerUNITEST INC·Filed 2013·Granted Apr 21, 2015·0 cites·8 claims
- 3035US2015039264A1Device for calculating round-trip time of memory test using programmable logicUNITEST INC·Filed 2014·Application pending·0 cites
- 3134US9197212B2Apparatus and method for correcting output signal of FPGA-based memory test deviceUNITEST INC·Filed 2014·Granted Nov 24, 2015·0 cites·4 claims
- 3229US9378845B2System for simultaneously determining memory test resultUNITEST INC·Filed 2014·Granted Jun 28, 2016·0 cites·3 claims
- 3327US9613718B2Detection system for detecting fail block using logic block address and data buffer address in a storage testerUNITEST INC·Filed 2014·Granted Apr 4, 2017·0 cites·5 claims
- 3426US11031091B2Apparatus and method for measuring round-trip time of test signal using programmable logicUNITEST INC·Filed 2018·Granted Jun 8, 2021·0 cites·6 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →