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UNITEST INC
KR26 patents
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US7302623B2Nov 27, 2007
Algorithm pattern generator for testing a memory device and memory tester using the same
UNITEST INC12 citations82
US6883128B2Apr 19, 2005
PC and ATE integrated chip test equipment
UNITEST INC12 citations80
US9171643B2Oct 27, 2015
Solid state drive tester
UNITEST INC5 citations69
US9153345B2Oct 6, 2015
Error generating apparatus for solid state drive tester
UNITEST INC4 citations69
US9411700B2Aug 9, 2016
Storage tester capable of individual control for a plurality of storage
UNITEST INC4 citations68
US7285967B2Oct 23, 2007
Probe card having deeply recessed trench and method for manufacturing the same
UNITEST INC7 citations68
US7459399B2Dec 2, 2008
Method for manufacturing probe structure of probe card
UNITEST INC6 citations62
US7872488B2Jan 18, 2011
Tester for testing semiconductor device
UNITEST INC5 citations60
US7739572B2Jun 15, 2010
Tester for testing semiconductor device
UNITEST INC4 citations60
US7656178B2Feb 2, 2010
Method for calibrating semiconductor device tester
UNITEST INC2 citations60
US7327151B2Feb 5, 2008
Memory application tester having vertically-mounted motherboard
UNITEST INC6 citations60
US9378846B2Jun 28, 2016
Non-mounted storage test device based on FPGA
UNITEST INC3 citations59
US7688099B2Mar 30, 2010
Sequential semiconductor device tester
UNITEST INC3 citations59
US7652497B2Jan 26, 2010
Sequential semiconductor device tester
UNITEST INC2 citations59
US7607056B2Oct 20, 2009
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
UNITEST INC4 citations59
US9159454B2Oct 13, 2015
Failure detection apparatus for solid state drive tester
UNITEST INC3 citations58
US7288949B2Oct 30, 2007
Semiconductor test interface
UNITEST INC5 citations55
US7875193B2Jan 25, 2011
Method for manufacturing probe structure of probe card
UNITEST INC0 citations50
US9245613B2Jan 26, 2016
Storage interface apparatus for solid state drive tester
UNITEST INC1 citations48
US9015545B2Apr 21, 2015
Solid state drive tester
UNITEST INC0 citations48
US9459302B2Oct 4, 2016
Device under test tester using redriver
UNITEST INC2 citations44
US11031091B2Jun 8, 2021
Apparatus and method for measuring round-trip time of test signal using programmable logic
UNITEST INC0 citations42
US9312030B2Apr 12, 2016
Apparatus and method for acquiring data of fast fail memory
UNITEST INC0 citations42
US9378845B2Jun 28, 2016
System for simultaneously determining memory test result
UNITEST INC0 citations31
US9197212B2Nov 24, 2015
Apparatus and method for correcting output signal of FPGA-based memory test device
UNITEST INC0 citations31
US9613718B2Apr 4, 2017
Detection system for detecting fail block using logic block address and data buffer address in a storage tester
UNITEST INC0 citations27