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UNITY SEMICONDUCTOR
FR20 patents
Top patents by PatentIndex Score
US10082425B2Sep 25, 2018
Integrated chromatic confocal sensor
UNITY SEMICONDUCTOR6 citations82
US9857313B2Jan 2, 2018
Method and system for inspecting wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR2 citations69
US12074400B1Aug 27, 2024
Substrate dimension adapter
UNITY SEMICONDUCTOR3 citations66
US10260868B2Apr 16, 2019
Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR1 citations59
US12444039B2Oct 14, 2025
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US12079979B2Sep 3, 2024
Method and a system for characterising structures through a substrate
UNITY SEMICONDUCTOR0 citations57
US11959736B2Apr 16, 2024
Method and a system for characterising structures etched in a substrate
UNITY SEMICONDUCTOR0 citations54
US11906302B2Feb 20, 2024
Method and system for measuring a surface of an object comprising different structures using low coherence interferometry
UNITY SEMICONDUCTOR0 citations52
US11713960B2Aug 1, 2023
Method and system for measuring a surface of an object comprising different structures using low coherence interferometry
UNITY SEMICONDUCTOR1 citations52
US11965834B2Apr 23, 2024
Dark-field optical inspection device
UNITY SEMICONDUCTOR0 citations47
US11300520B2Apr 12, 2022
Method and system for optically inspecting a substrate
UNITY SEMICONDUCTOR0 citations47
US11959737B2Apr 16, 2024
Method and a system for combined characterisation of structures etched in a substrate
UNITY SEMICONDUCTOR0 citations44
US11942379B1Mar 26, 2024
Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method
UNITY SEMICONDUCTOR0 citations44
US12163899B2Dec 10, 2024
System for optical inspection of a substrate using same or different wavelengths
UNITY SEMICONDUCTOR0 citations42
US11092644B2Aug 17, 2021
Method and system for inspecting boards for microelectronics or optics by laser doppler effect
UNITY SEMICONDUCTOR0 citations42
US12123698B1Oct 22, 2024
Method and a system for characterizing structures through a substrate
UNITY SEMICONDUCTOR0 citations41
US12590905B2Mar 31, 2026
Method and system for discriminating defects present on a frontside from defects present on a backside of a transparent substrate
UNITY SEMICONDUCTOR0 citations40
US11287246B2Mar 29, 2022
Method and device for inspecting a surface of an object comprising nonsimilar materials
UNITY SEMICONDUCTOR0 citations39
US10684233B2Jun 16, 2020
Positioning device for an integrated circuit board, and inspection apparatus for an integrated circuit board comprising such a positioning device
UNITY SEMICONDUCTOR0 citations32
US12196681B1Jan 14, 2025
Method and a device for detecting crystalline defects in a substrate by dark field and photoluminescence
UNITY SEMICONDUCTOR0 citations30