Assignee
VERIGY PTE LTD SINGAPORE
SG·109 granted patents·4 pending applications·665 citations·filing 2002–2010
Top patents by PatentIndex Score
113 records- 0193US7590903B2Re-configurable architecture for automated test equipmentVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 15, 2009·28 cites·17 claims
- 0291US7872482B2High density interconnect system having rapid fabrication cycleVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 18, 2011·21 cites·24 claims
- 0389US7952373B2Construction structures and manufacturing processes for integrated circuit wafer probe card assembliesVERIGY PTE LTD SINGAPORE·Filed 2006·Granted May 31, 2011·17 cites·16 claims
- 0489US7743304B2Test system and method for testing electronic devices using a pipelined testing architectureVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 22, 2010·17 cites·20 claims
- 0587US7279919B2Systems and methods of allocating device testing resources to sites of a probe cardVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Oct 9, 2007·16 cites·28 claims
- 0686US7853846B2Locating hold time violations in scan chains by generating patterns on ATEVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Dec 14, 2010·21 cites·6 claims
- 0786US7791525B2Time-to-digital conversion with calibration pulse injectionVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 7, 2010·14 cites·16 claims
- 0886US7707468B2System and method for electronic testing of multiple memory devicesVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Apr 27, 2010·20 cites·20 claims
- 0985US7712000B2ATE architecture and method for DFT oriented testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted May 4, 2010·14 cites·14 claims
- 1085US7457729B2Model based testing for electronic devicesVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Nov 25, 2008·14 cites·37 claims
- 1184US7421632B2Mapping logic for controlling loading of the select ram of an error data crossbar multiplexerVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 2, 2008·14 cites·6 claims
- 1284US7250892B2Data converter with integrated MEMS resonator clockVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Jul 31, 2007·18 cites·10 claims
- 1383US7512858B2Method and system for per-pin clock synthesis of an electronic device under testVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Mar 31, 2009·10 cites·15 claims
- 1483US7355378B2Source synchronous samplingVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Apr 8, 2008·14 cites·15 claims
- 1583US7315170B2Calibration apparatus and method using pulse for frequency, phase, and delay characteristicVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jan 1, 2008·15 cites·3 claims
- 1679US7552530B2Method of manufacturing a PCB having improved coolingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 30, 2009·7 cites·7 claims
- 1779US7519827B2Provisioning and use of security tokens to enable automated test equipmentVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Apr 14, 2009·30 cites·22 claims
- 1879US7260493B2Testing a device under test by sampling its clock and data signalVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 21, 2007·15 cites·15 claims
- 1978US7650547B2Apparatus for locating a defect in a scan chain while testing digital logicVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 19, 2010·9 cites·6 claims
- 2078US7412639B2System and method for testing circuitry on a waferVERIGY PTE LTD SINGAPORE·Filed 2002·Granted Aug 12, 2008·30 cites·26 claims
- 2176US7924043B2Method and product for testing a device under testVERIGY PTE LTD SINGAPORE·Filed 2009·Granted Apr 12, 2011·8 cites·8 claims
- 2276US7865788B2Dynamic mask memory for serial scan testingVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 4, 2011·8 cites·7 claims
- 2376US7274202B2Carousel device, system and method for electronic circuit testerVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Sep 25, 2007·6 cites·7 claims
- 2476US7252555B2Pin connectorVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Aug 7, 2007·20 cites·11 claims
- 2575US7859277B2Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe arrayVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 28, 2010·7 cites·6 claims
- 2675US7550988B2Test device with test parameter adaptationVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 23, 2009·8 cites·16 claims
- 2775US7378860B2Wafer test head architecture and method of useVERIGY PTE LTD SINGAPORE·Filed 2006·Granted May 27, 2008·8 cites·14 claims
- 2873US7414558B2Digital to analog conversion using summation of multiple DACsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 19, 2008·10 cites·15 claims
- 2972US7320617B1Electrical coupling apparatus and methodVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jan 22, 2008·14 cites·20 claims
- 3070US8010856B2Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chainsVERIGY PTE LTD SINGAPORE·Filed 2008·Granted Aug 30, 2011·7 cites·23 claims
- 3170US7934710B2Clamp and method for operating sameVERIGY PTE LTD SINGAPORE·Filed 2007·Granted May 3, 2011·9 cites·22 claims
- 3270US7782242B2Time-to-digital conversion with delay contribution determination of delay elementsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 24, 2010·7 cites·13 claims
- 3370US7397235B2Pin electronic for automatic testing of integrated circuitsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jul 8, 2008·9 cites·10 claims
- 3469US7378862B2Method and apparatus for eliminating automated testing equipment index timeVERIGY PTE LTD SINGAPORE·Filed 2005·Granted May 27, 2008·6 cites·5 claims
- 3569US7218095B2Method and apparatus for electromagnetic interference shielding in an automated test systemVERIGY PTE LTD SINGAPORE·Filed 2004·Granted May 15, 2007·14 cites·4 claims
- 3668US7519887B2Apparatus for storing and formatting dataVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Apr 14, 2009·5 cites·15 claims
- 3767US8006149B2System and method for device performance characterization in physical and logical domains with AC SCAN testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 23, 2011·5 cites·12 claims
- 3867US7812626B2High density interconnect system for IC packages and interconnect assembliesVERIGY PTE LTD SINGAPORE·Filed 2009·Granted Oct 12, 2010·5 cites·12 claims
- 3967US7768278B2High impedance, high parallelism, high temperature memory test system architectureVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Aug 3, 2010·4 cites·13 claims
- 4067US7420385B2System-on-a-chip pipeline tester and methodVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Sep 2, 2008·7 cites·35 claims
- 4167US7339844B2Memory device fail summary data reduction for improved redundancy analysisVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Mar 4, 2008·5 cites·8 claims
- 4266US8010933B2Source synchronous timing extraction, cyclization and samplingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 30, 2011·4 cites·12 claims
- 4366US7434118B2Parameterized signal conditioningVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Oct 7, 2008·14 cites·25 claims
- 4465US7386777B2Systems and methods for processing automatically generated test patternsVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Jun 10, 2008·11 cites·25 claims
- 4565US7366937B2Fast synchronization of a number of digital clocksVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Apr 29, 2008·3 cites·17 claims
- 4664US7853828B2Graphically extensible, hardware independent method to inspect and modify state of test equipmentVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 14, 2010·3 cites·10 claims
- 4763US7574185B2Method and apparatus for generating a phase-locked output signalVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Aug 11, 2009·12 cites·20 claims
- 4863US7290189B2Compilation of calibration information for plural testflowsVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Oct 30, 2007·4 cites·20 claims
- 4963US7262620B2Resource matrix, system, and method for operating sameVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Aug 28, 2007·4 cites·18 claims
- 5063US7253760B2Method for adjusting signal generator and signal generatorVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 7, 2007·5 cites·20 claims
Showing the top 50 of 113 patent records by PatentIndex Score.
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