Assignee
WAJATA TAKAYUKI
JP·2 granted patents·4 citations·filing 2007–2008
Top patents by PatentIndex Score
2 records- 0150US8324918B2Probe needle material, probe needle and probe card each using the same, and inspection processWAJATA TAKAYUKI·Filed 2008·Granted Dec 4, 2012·4 cites·6 claims
- 0237US8072560B2Electrode for cold cathode tube, and cold cathode tube and liquid crystal display device using the sameWAJATA TAKAYUKI·Filed 2007·Granted Dec 6, 2011·0 cites·12 claims
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