Assignee
WAKAMIYA YUJI
JP·11 granted patents·1 pending application·58 citations·filing 2008–2012
Top patents by PatentIndex Score
12 records- 0193US9304140B2Sample analyzerWAKAMIYA YUJI·Filed 2011·Granted Apr 5, 2016·18 cites·15 claims
- 0282US8535607B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Sep 17, 2013·9 cites·9 claims
- 0377US9201083B2Sample analyzer and reagent management methodWAKAMIYA YUJI·Filed 2011·Granted Dec 1, 2015·3 cites·11 claims
- 0477US8329103B2Sample analyzer and method for analyzing samplesWAKAMIYA YUJI·Filed 2008·Granted Dec 11, 2012·10 cites·11 claims
- 0575US8231830B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Jul 31, 2012·8 cites·12 claims
- 0672US8871147B2Sample analyzer and storage mediumWAKAMIYA YUJI·Filed 2012·Granted Oct 28, 2014·2 cites·12 claims
- 0770US8071029B2Sample analyzer and sample analyzing methodWAKAMIYA YUJI·Filed 2008·Granted Dec 6, 2011·3 cites·12 claims
- 0867US8425839B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Apr 23, 2013·2 cites·19 claims
- 0967US8335662B2Sample analyzer and error information displaying methodWAKAMIYA YUJI·Filed 2010·Granted Dec 18, 2012·2 cites·6 claims
- 1059US9606133B2Specimen analyzer and specimen analyzing methodWAKAMIYA YUJI·Filed 2011·Granted Mar 28, 2017·1 cites·16 claims
- 1154US8279715B2Sample analyzing apparatusWAKAMIYA YUJI·Filed 2011·Granted Oct 2, 2012·0 cites·17 claims
- 1243US2013034466A1Sample analyzerWAKAMIYA YUJI·Filed 2012·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →