Assignee
WALECKI WOJCIECH JAN
US·2 granted patents·1 pending application·1 citations·filing 2020–2024
Top patents by PatentIndex Score
3 records- 0174US11226190B2Measurement of thickness and topography of a slab of materialsWALECKI WOJCIECH JAN·Filed 2020·Granted Jan 18, 2022·1 cites·20 claims
- 0257US11885609B2Wafer thickness, topography, and layer thickness metrology systemWALECKI WOJCIECH JAN·Filed 2021·Granted Jan 30, 2024·0 cites·3 claims
- 0357US2026002773A1Multibeam optical lever profilerWALECKI WOJCIECH JAN·Filed 2024·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →