Assignee
WANG ZHIYUAN
US·2 granted patents·13 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0175US8560903B2System and method for executing functional scanning in an integrated circuit environmentWANG ZHIYUAN·Filed 2010·Granted Oct 15, 2013·7 cites·20 claims
- 0263US8560474B2System and method for providing adaptive manufacturing diagnoses in a circuit board environmentWANG ZHIYUAN·Filed 2011·Granted Oct 15, 2013·6 cites·20 claims
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