Assignee
WENTWORTH LAB INC
US26 patents
Top patents by PatentIndex Score
US6124723ASep 26, 2000
Probe holder for low voltage, low current measurements in a water probe station
WENTWORTH LAB INC108 citations97
US5355079AOct 11, 1994
Probe assembly for testing integrated circuit devices
WENTWORTH LAB INC154 citations97
US6297657B1Oct 2, 2001
Temperature compensated vertical pin probing device
WENTWORTH LAB INC88 citations96
US5416429AMay 16, 1995
Probe assembly for testing integrated circuits
WENTWORTH LAB INC158 citations96
US3930809AJan 6, 1976
Assembly fixture for fixed point probe card
WENTWORTH LAB INC165 citations96
US6927586B2Aug 9, 2005
Temperature compensated vertical pin probing device
WENTWORTH LAB INC77 citations95
US4719417AJan 12, 1988
Multi-level test probe assembly for IC chips
WENTWORTH LAB INC107 citations95
US4599559AJul 8, 1986
Test probe assembly for IC chips
WENTWORTH LAB INC75 citations95
US4382228AMay 3, 1983
Probes for fixed point probe cards
WENTWORTH LAB INC65 citations95
US6160412ADec 12, 2000
Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment
WENTWORTH LAB INC114 citations94
US6031383AFeb 29, 2000
Probe station for low current, low voltage parametric measurements using multiple probes
WENTWORTH LAB INC154 citations94
US5959461ASep 28, 1999
Probe station adapter for backside emission inspection
WENTWORTH LAB INC141 citations93
US6163162ADec 19, 2000
Temperature compensated vertical pin probing device
WENTWORTH LAB INC30 citations91
US6661244B2Dec 9, 2003
Nickel alloy probe card frame laminate
WENTWORTH LAB INC35 citations90
US6566898B2May 20, 2003
Temperature compensated vertical pin probing device
WENTWORTH LAB INC50 citations90
US6255602B1Jul 3, 2001
Multiple layer electrical interface
WENTWORTH LAB INC45 citations89
US6906540B2Jun 14, 2005
Method for chemically etching photo-defined micro electrical contacts
WENTWORTH LAB INC31 citations88
US6756797B2Jun 29, 2004
Planarizing interposer for thermal compensation of a probe card
WENTWORTH LAB INC37 citations86
US7388392B2Jun 17, 2008
Die design with integrated assembly aid
WENTWORTH LAB INC8 citations73
US7282936B2Oct 16, 2007
Die design with integrated assembly aid
WENTWORTH LAB INC9 citations73
US6977515B2Dec 20, 2005
Method for forming photo-defined micro electrical contacts
WENTWORTH LAB INC10 citations66
US7554348B2Jun 30, 2009
Multi-offset die head
WENTWORTH LAB INC6 citations62
US7649372B2Jan 19, 2010
Die design with integrated assembly aid
WENTWORTH LAB INC3 citations56
US7282934B2Oct 16, 2007
Flexible microcircuit space transformer assembly
WENTWORTH LAB INC5 citations50
US7145353B2Dec 5, 2006
Double side probing of semiconductor devices
WENTWORTH LAB INC3 citations48
US7392563B2Jul 1, 2008
Probe pin cleaning system
WENTWORTH LAB INC0 citations47