Assignee
WIECZOREK KARSTEN
DE·1 granted patent·3 pending applications·2 citations·filing 2005–2008
Top patents by PatentIndex Score
4 records- 0155US8097542B2Etch stop layer of reduced thickness for patterning a dielectric material in a contact level of closely spaced transistorsWIECZOREK KARSTEN·Filed 2008·Granted Jan 17, 2012·2 cites·20 claims
- 0238US2007232033A1Method for forming ultra-shallow high quality junctions by a combination of solid phase epitaxy and laser annealingWIECZOREK KARSTEN·Filed 2006·Application pending·0 cites
- 0335US2006148163A1Method of forming gate insulation layers of different characteristicsWIECZOREK KARSTEN·Filed 2005·Application pending·0 cites
- 0432US2006244069A1Semiconductor device having a gate dielectric of different blocking characteristicsWIECZOREK KARSTEN·Filed 2005·Application pending·0 cites
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