Assignee
Wang yi-xiang
US·6 granted patents·29 citations·filing 2008–2011
Top patents by PatentIndex Score
6 records- 0188US8908348B2Wafer grounding and biasing method, apparatus, and applicationWang yi-xiang·Filed 2009·Granted Dec 9, 2014·12 cites·16 claims
- 0287US8624186B2Movable detector for charged particle beam inspection or reviewWang yi-xiang·Filed 2010·Granted Jan 7, 2014·8 cites·20 claims
- 0378US8094428B2Wafer grounding methodologyWANG YI XIANG·Filed 2008·Granted Jan 10, 2012·7 cites·17 claims
- 0470US8237125B2Particle detection systemWang yi-xiang·Filed 2010·Granted Aug 7, 2012·2 cites·18 claims
- 0553US8552377B2Particle detection systemWang yi-xiang·Filed 2010·Granted Oct 8, 2013·0 cites·16 claims
- 0647US8698070B2Phase detectorWang yi-xiang·Filed 2011·Granted Apr 15, 2014·0 cites·19 claims
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