Assignee
XIONG YAN
US3 patents
Top patents by PatentIndex Score
US8112241B2Feb 7, 2012
Methods and systems for generating an inspection process for a wafer
XIONG YAN33 citations91
US8107415B2Jan 31, 2012
Method and system for transferring time division multiplexing service data
XIONG YAN2 citations58
US8717970B2May 6, 2014
Method and system for transferring time division multiplexing service data
XIONG YAN0 citations48