Assignee
YAGUCHI TOSHIE
JP·4 granted patents·25 citations·filing 2010–2012
Top patents by PatentIndex Score
4 records- 0185US8878144B2Electron microscope and sample holderYAGUCHI TOSHIE·Filed 2010·Granted Nov 4, 2014·9 cites·14 claims
- 0285US8835847B2Sample holding apparatus for electron microscope, and electron microscope apparatusYAGUCHI TOSHIE·Filed 2012·Granted Sep 16, 2014·8 cites·20 claims
- 0382US8604429B2Electron beam device and sample holding device for electron beam deviceYAGUCHI TOSHIE·Filed 2010·Granted Dec 10, 2013·7 cites·12 claims
- 0461US9099281B2Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatusYAGUCHI TOSHIE·Filed 2010·Granted Aug 4, 2015·1 cites·28 claims
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