Assignee
YAMAKAWA SHINJI
JP·3 granted patents·10 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0183US8917903B2Image inspection apparatus, image forming apparatus, image inspection method, and image inspection programYAMAKAWA SHINJI·Filed 2012·Granted Dec 23, 2014·4 cites·6 claims
- 0279US8810861B2Image processing apparatus, image noise detecting method, and computer-readable recording medium which averages pixel values of multiple pixels aligned in the sub-scanning directionYAMAKAWA SHINJI·Filed 2012·Granted Aug 19, 2014·4 cites·4 claims
- 0369US8538086B2Image inspection apparatus, image inspection method, and computer program productYAMAKAWA SHINJI·Filed 2010·Granted Sep 17, 2013·2 cites·9 claims
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