Assignee
YAMANAKA KAZUSHI
JP·2 granted patents·4 citations·filing 2007–2009
Top patents by PatentIndex Score
2 records- 0164US8220310B2Gas analyzer and method of gas analysisYAMANAKA KAZUSHI·Filed 2007·Granted Jul 17, 2012·2 cites·12 claims
- 0259US8559696B2Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesionYAMANAKA KAZUSHI·Filed 2009·Granted Oct 15, 2013·2 cites·19 claims
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