Assignee
YAO TERUYOSHI
JP·2 granted patents·0 citations·filing 2010–2012
Technology mixG03F2
Top patents by PatentIndex Score
2 records- 0150US8553198B2Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposureYAO TERUYOSHI·Filed 2012·Granted Oct 8, 2013·0 cites·2 claims
- 0245US8227153B2Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposureYAO TERUYOSHI·Filed 2010·Granted Jul 24, 2012·0 cites·1 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →