Assignee
YOKOU HIDEYUKI
JP·3 granted patents·1 pending application·16 citations·filing 2012–2012
Top patents by PatentIndex Score
4 records- 0187US8717839B2Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereofYOKOU HIDEYUKI·Filed 2012·Granted May 6, 2014·13 cites·20 claims
- 0259US8390318B2Semiconductor device having calibration circuit for adjusting output impedance of output buffer circuitYOKOU HIDEYUKI·Filed 2012·Granted Mar 5, 2013·3 cites·12 claims
- 0346US8665008B2Semiconductor device that can cancel noise in bias line to which bias current flowsYOKOU HIDEYUKI·Filed 2012·Granted Mar 4, 2014·0 cites·20 claims
- 0437US2012262196A1Semiconductor device including plural core chips and interface chip that controls the core chips and control method thereofYOKOU HIDEYUKI·Filed 2012·Application pending·0 cites
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