Assignee
YOKOYAMA MITSURU
JP·1 granted patent·3 pending applications·36 citations·filing 2006–2012
Top patents by PatentIndex Score
4 records- 0193US9748012B2Method for manufacturing metal grating structure, metal grating structure manufactured by the method, and X-ray imaging device using the metal grating structureYOKOYAMA MITSURU·Filed 2011·Granted Aug 29, 2017·36 cites·14 claims
- 0258US2014241493A1Metal Lattice Production Method, Metal Lattice, X-Ray Imaging Device, and Intermediate Product for Metal LatticeYOKOYAMA MITSURU·Filed 2012·Application pending·0 cites
- 0341US2008298449A1Method and an apparatus for measuring error vector magnitude, and a measuring apparatus or signal source evaluated or assessed by this methodYOKOYAMA MITSURU·Filed 2007·Application pending·0 cites
- 0439US2007165702A1Apparatus for measuring frequency error of CDMA signalsYOKOYAMA MITSURU·Filed 2006·Application pending·0 cites
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