Assignee
YOSHIKAWA RYOJI
JP·1 granted patent·1 pending application·3 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0164US8811713B2Photomask inspection method, semiconductor device inspection method, and pattern inspection apparatusYOSHIKAWA RYOJI·Filed 2009·Granted Aug 19, 2014·3 cites·6 claims
- 0233US2011237087A1Pattern inspection method and semiconductor device manufacturing methodYOSHIKAWA RYOJI·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →