Assignee
ZEWAIL AHMED H
US·5 granted patents·59 citations·filing 2009–2012
Technology mixH01J5
Top patents by PatentIndex Score
5 records- 0195US8247769B2Characterization of nanoscale structures using an ultrafast electron microscopeZEWAIL AHMED H·Filed 2009·Granted Aug 21, 2012·24 cites·18 claims
- 0294US8203120B24D imaging in an ultrafast electron microscopeZEWAIL AHMED H·Filed 2009·Granted Jun 19, 2012·19 cites·41 claims
- 0393US8440970B2Characterization of nanoscale structures using an ultrafast electron microscopeZEWAIL AHMED H·Filed 2012·Granted May 14, 2013·13 cites·20 claims
- 0467US8429761B2Photon induced near field electron microscope and biological imaging systemZEWAIL AHMED H·Filed 2010·Granted Apr 23, 2013·2 cites·22 claims
- 0553US8841613B2Method and system for 4D tomography and ultrafast scanning electron microscopyZEWAIL AHMED H·Filed 2010·Granted Sep 23, 2014·1 cites·29 claims
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