Assignee

ZIAJA THOMAS A

US·2 granted patents·11 citations·filing 2008–2009

Technology mixG01R2 G06F1 G11C1

Top patents by PatentIndex Score

2 records

0168US8074133B2Method and apparatus for testing delay faultsZIAJA THOMAS A·Filed 2008·Granted Dec 6, 2011·7 cites·19 claims
0249US8065572B2At-speed scan testing of memory arraysZIAJA THOMAS A·Filed 2009·Granted Nov 22, 2011·4 cites·18 claims

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