Assignee
ACT ADVANCED CIRCUIT TESTING
DE·7 granted patents·99 citations·filing 1994–1997
Top patents by PatentIndex Score
7 records- 0176US5780859AElectrostatic-magnetic lens arrangementACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Jul 14, 1998·30 cites·22 claims
- 0263US5895917ADetector objective lensACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Apr 20, 1999·17 cites·27 claims
- 0359US6051838AOptical unitACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Apr 18, 2000·14 cites·23 claims
- 0458US5847399ADeflection systemACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Dec 8, 1998·13 cites·16 claims
- 0552US5885354AMethod and apparatus for processing a specimenACT ADVANCED CIRCUIT TESTING·Filed 1996·Granted Mar 23, 1999·14 cites·5 claims
- 0646US5808309AApparatus for generating an electron beamACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Sep 15, 1998·7 cites·12 claims
- 0733US5637538AMethod and apparatus for processing a specimenACT ADVANCED CIRCUIT TESTING·Filed 1994·Granted Jun 10, 1997·4 cites·4 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →