Assignee
ADVANCED MICRO DEVICES IN
US·2 granted patents·33 citations·filing 2001–2002
Top patents by PatentIndex Score
2 records- 0174US6399401B1Test structures for electrical linewidth measurement and processes for their formationADVANCED MICRO DEVICES IN·Filed 2001·Granted Jun 4, 2002·17 cites·20 claims
- 0266US6532175B1Method and apparatus for soft program verification in a memory deviceADVANCED MICRO DEVICES IN·Filed 2002·Granted Mar 11, 2003·16 cites·25 claims
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