Assignee
ADVANCED MICRON DEVICES INC
US·5 granted patents·1 pending application·92 citations·filing 1999–2005
Top patents by PatentIndex Score
6 records- 0191US6433871B1Method of using scatterometry measurements to determine and control gate electrode profilesADVANCED MICRON DEVICES INC·Filed 2001·Granted Aug 13, 2002·56 cites·77 claims
- 0280US6165314AApparatus for performing jet vapor reduction of the thickness of process layersADVANCED MICRON DEVICES INC·Filed 2000·Granted Dec 26, 2000·20 cites·65 claims
- 0365US6780568B1Phase-shift photomask for patterning high density featuresADVANCED MICRON DEVICES INC·Filed 2002·Granted Aug 24, 2004·7 cites·3 claims
- 0440US2006179231A1System having cache memory and method of accessingADVANCED MICRON DEVICES INC·Filed 2005·Application pending·0 cites
- 0538US6265304B1Controlling an etching process of multiple layers based upon thickness ratio of the dielectric layersADVANCED MICRON DEVICES INC·Filed 1999·Granted Jul 24, 2001·7 cites·38 claims
- 0633US6261909B1Semiconductor device having ultra shallow junctions and a reduced channel length and method for making sameADVANCED MICRON DEVICES INC·Filed 1999·Granted Jul 17, 2001·2 cites·58 claims
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