Assignee
ADVANCED RESEARCH AND APPLIC C
US·5 granted patents·1,193 citations·filing 1983–1997
Top patents by PatentIndex Score
5 records- 0196US5838759ASingle beam photoneutron probe and X-ray imaging system for contraband detection and identificationADVANCED RESEARCH AND APPLIC C·Filed 1997·Granted Nov 17, 1998·563 cites·15 claims
- 0296US5638420AStraddle inspection systemADVANCED RESEARCH AND APPLIC C·Filed 1996·Granted Jun 10, 1997·428 cites·48 claims
- 0391US4575676AMethod and apparatus for radiation testing of electron devicesADVANCED RESEARCH AND APPLIC C·Filed 1983·Granted Mar 11, 1986·126 cites·18 claims
- 0480US4816753AMethod for reliability testing of integrated circuitsADVANCED RESEARCH AND APPLIC C·Filed 1987·Granted Mar 28, 1989·49 cites·8 claims
- 0577US4775220AOptical system with laser pulse energy controlADVANCED RESEARCH AND APPLIC C·Filed 1987·Granted Oct 4, 1988·27 cites·11 claims
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