Assignee
ADVANTEST AMERICA R & D CT INC
US·6 granted patents·215 citations·filing 2004–2004
Top patents by PatentIndex Score
6 records- 0192US7184917B2Method and system for controlling interchangeable components in a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Feb 27, 2007·63 cites·26 claims
- 0291US7209851B2Method and structure to develop a test program for semiconductor integrated circuitsADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·60 cites·30 claims
- 0388US7197417B2Method and structure to develop a test program for semiconductor integrated circuitsADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Mar 27, 2007·44 cites·30 claims
- 0483US7210087B2Method and system for simulating a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·32 cites·34 claims
- 0559US7197416B2Supporting calibration and diagnostics in an open architecture test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Mar 27, 2007·8 cites·26 claims
- 0658US7430486B2Datalog support in a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Sep 30, 2008·8 cites·14 claims
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