Assignee
ADVANTEST CORP
JP·1,865 granted patents·332 pending applications·27,706 citations·filing 1985–2025
Top patents by PatentIndex Score
2,197 records- 0199US6250933B1Contact structure and production method thereofADVANTEST CORP·Filed 2000·Granted Jun 26, 2001·209 cites·17 claims
- 0298US11143697B2Automated handling of different form factor devices under test in test cellADVANTEST CORP·Filed 2017·Granted Oct 12, 2021·33 cites·27 claims
- 0397US6795496B1Jitter measuring device and methodADVANTEST CORP·Filed 2000·Granted Sep 21, 2004·117 cites·19 claims
- 0497US6249893B1Method and structure for testing embedded cores based system-on-a-chipADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·199 cites·17 claims
- 0597US6208161B1Differential signal transmission circuitADVANTEST CORP·Filed 1998·Granted Mar 27, 2001·262 cites·11 claims
- 0697US6174744B1Method of producing micro contact structure and contact probe using sameADVANTEST CORP·Filed 2000·Granted Jan 16, 2001·248 cites·12 claims
- 0796US10288681B2Test architecture with a small form factor test board for rapid prototypingADVANTEST CORP·Filed 2018·Granted May 14, 2019·11 cites·27 claims
- 0896US6677245B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted Jan 13, 2004·100 cites·20 claims
- 0996US6586956B2Probe contract system having planarity adjustment mechanismADVANTEST CORP·Filed 2001·Granted Jul 1, 2003·75 cites·29 claims
- 1096US6331770B1Application specific event based semiconductor test systemADVANTEST CORP·Filed 2000·Granted Dec 18, 2001·90 cites·12 claims
- 1195US11579187B1Test carrier and electronic component testing apparatusADVANTEST CORP·Filed 2022·Granted Feb 14, 2023·2 cites·16 claims
- 1295US11009550B2Test architecture with an FPGA based test board to simulate a DUT or end-pointADVANTEST CORP·Filed 2018·Granted May 18, 2021·9 cites·20 claims
- 1395US8988095B2Socket and electronic device test apparatusADVANTEST CORP·Filed 2012·Granted Mar 24, 2015·18 cites·5 claims
- 1495US7809520B2Test equipment, method for loading test plan and program productADVANTEST CORP·Filed 2007·Granted Oct 5, 2010·36 cites·14 claims
- 1595US6676438B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2001·Granted Jan 13, 2004·92 cites·20 claims
- 1695US6678645B1Method and apparatus for SoC design validationADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·276 cites·33 claims
- 1795US6576485B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2002·Granted Jun 10, 2003·74 cites·15 claims
- 1895US6487700B1Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using itADVANTEST CORP·Filed 2000·Granted Nov 26, 2002·89 cites·9 claims
- 1995US6031282AHigh performance integrated circuit chip packageADVANTEST CORP·Filed 1998·Granted Feb 29, 2000·187 cites·14 claims
- 2095US5865319AAutomatic test handler system for IC testerADVANTEST CORP·Filed 1996·Granted Feb 2, 1999·146 cites·23 claims
- 2195US5172049AIC test equipmentADVANTEST CORP·Filed 1991·Granted Dec 15, 1992·175 cites·5 claims
- 2295US5113139ALow-distortion waveform generating method and waveform generator using the sameADVANTEST CORP·Filed 1991·Granted May 12, 1992·162 cites·4 claims
- 2394US11430536B2Software-focused solution for arbitrary all-data odd sector size supportADVANTEST CORP·Filed 2021·Granted Aug 30, 2022·5 cites·19 claims
- 2494US10884847B1Fast parallel CRC determination to support SSD testingADVANTEST CORP·Filed 2019·Granted Jan 5, 2021·14 cites·20 claims
- 2594US10114067B2Integrated waveguide structure and socket structure for millimeter waveband testingADVANTEST CORP·Filed 2016·Granted Oct 30, 2018·20 cites·24 claims
- 2694US7679391B2Test equipment and semiconductor deviceADVANTEST CORP·Filed 2008·Granted Mar 16, 2010·27 cites·17 claims
- 2794US7509517B2Clock transferring apparatus for synchronizing input data with internal clock and test apparatus having the sameADVANTEST CORP·Filed 2006·Granted Mar 24, 2009·37 cites·7 claims
- 2894US7132844B2Testing device and testing method for testing an electronic deviceADVANTEST CORP·Filed 2005·Granted Nov 7, 2006·28 cites·16 claims
- 2994US7020360B2Wavelength dispersion probing systemADVANTEST CORP·Filed 2002·Granted Mar 28, 2006·113 cites·11 claims
- 3094US6975978B1Method and apparatus for fault simulation of semiconductor integrated circuitADVANTEST CORP·Filed 2000·Granted Dec 13, 2005·64 cites·9 claims
- 3194US6787780B2Multi-beam exposure apparatus using a multi-axis electron lens, fabrication method of a semiconductor deviceADVANTEST CORP·Filed 2001·Granted Sep 7, 2004·51 cites·21 claims
- 3294US6736665B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted May 18, 2004·66 cites·10 claims
- 3394US6464511B1IC socket and IC testerADVANTEST CORP·Filed 1999·Granted Oct 15, 2002·139 cites·5 claims
- 3494US5440260AVariable delay circuitADVANTEST CORP·Filed 1994·Granted Aug 8, 1995·117 cites·2 claims
- 3593US7978109B1Output apparatus and test apparatusADVANTEST CORP·Filed 2010·Granted Jul 12, 2011·20 cites·14 claims
- 3693US7340364B1Test apparatus, and control methodADVANTEST CORP·Filed 2006·Granted Mar 4, 2008·37 cites·7 claims
- 3793US6917102B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2003·Granted Jul 12, 2005·71 cites·20 claims
- 3893US6687868B1Test device and method for electrically testing electronic deviceADVANTEST CORP·Filed 2000·Granted Feb 3, 2004·60 cites·26 claims
- 3993US6651204B1Modular architecture for memory testing on event based test systemADVANTEST CORP·Filed 2000·Granted Nov 18, 2003·64 cites·13 claims
- 4093US6436802B1Method of producing contact structureADVANTEST CORP·Filed 2000·Granted Aug 20, 2002·66 cites·36 claims
- 4193US6066822ASemiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted May 23, 2000·94 cites·7 claims
- 4293US6052284APrinted circuit board with electronic devices mounted thereonADVANTEST CORP·Filed 1997·Granted Apr 18, 2000·166 cites·31 claims
- 4393US5767690ATest head cooling systemADVANTEST CORP·Filed 1997·Granted Jun 16, 1998·104 cites·1 claims
- 4493US5313156AApparatus for automatic handlingADVANTEST CORP·Filed 1991·Granted May 17, 1994·179 cites·24 claims
- 4593US4602220AVariable frequency synthesizer with reduced phase noiseADVANTEST CORP·Filed 1985·Granted Jul 22, 1986·155 cites·20 claims
- 4692US11313850B2Small particle measurement systemADVANTEST CORP·Filed 2019·Granted Apr 26, 2022·3 cites·6 claims
- 4792US11181576B2Electronic component handling apparatus and electronic component testing apparatusADVANTEST CORP·Filed 2020·Granted Nov 23, 2021·5 cites·10 claims
- 4892US10161993B2Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA blockADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·18 cites·25 claims
- 4992US10162007B2Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independentlyADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·13 cites·32 claims
- 5092US9291667B2Adaptive thermal controlADVANTEST CORP·Filed 2014·Granted Mar 22, 2016·45 cites·24 claims
Showing the top 50 of 2,197 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →