Assignee
ADVANTEST TEST SOLUTIONS INC
US·34 granted patents·9 pending applications·118 citations·filing 2017–2025
Top patents by PatentIndex Score
43 records- 0198US11587640B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 21, 2023·6 cites·15 claims
- 0298US11573262B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 7, 2023·9 cites·21 claims
- 0398US10656200B2High volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2017·Granted May 19, 2020·35 cites·13 claims
- 0497US11674999B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Jun 13, 2023·10 cites·25 claims
- 0596US11852678B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 26, 2023·2 cites·21 claims
- 0696US11821913B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 21, 2023·4 cites·20 claims
- 0796US11567119B2Testing system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 31, 2023·10 cites·14 claims
- 0895US11835549B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 5, 2023·3 cites·20 claims
- 0995US11754620B2DUT placement and handling for active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Sep 12, 2023·2 cites·24 claims
- 1095US11493551B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2020·Granted Nov 8, 2022·28 cites·16 claims
- 1194US12174248B2Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test systemADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 24, 2024·5 cites·20 claims
- 1293US11742055B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Aug 29, 2023·2 cites·20 claims
- 1390US12411167B2Tension-based socket gimbal for engaging device under test with thermal arrayADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Sep 9, 2025·1 cites·20 claims
- 1488US2025093408A1Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 1587US11808812B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 7, 2023·1 cites·20 claims
- 1687US2025130276A1Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 1785US12540968B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Feb 3, 2026·0 cites·30 claims
- 1885US12540967B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Feb 3, 2026·0 cites·30 claims
- 1985US12535522B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Jan 27, 2026·0 cites·30 claims
- 2085US2025102565A1Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2183US12216154B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 2282US12203979B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 2381US12374420B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 2481US12345756B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 1, 2025·0 cites·18 claims
- 2581US12320852B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 2681US12210056B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 2780US12203958B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·17 claims
- 2879US11846669B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 19, 2023·0 cites·29 claims
- 2979US11774492B2Test system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Oct 3, 2023·0 cites·23 claims
- 3078US11940487B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 3177US11609266B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Mar 21, 2023·0 cites·18 claims
- 3276US12235315B2Test system support component exchange system and methodADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Feb 25, 2025·0 cites·13 claims
- 3375US12320841B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jun 3, 2025·0 cites·27 claims
- 3474US11841392B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 12, 2023·0 cites·27 claims
- 3572US11549981B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 3669US2025363023A1Testing systems and methods with cross-platform bridge componentsADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 3765US12235314B2Parallel test cell with self actuated socketsADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 3864US2025363022A1Testing systems and methods with cross-platform bridge componentsADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 3960US11656273B1High current device testing apparatus and systemsADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted May 23, 2023·0 cites·26 claims
- 4056US2024183897A1Wafer scale active thermal interposer with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 4156US2024183898A1Active thermal interposer device with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 4250US2025102562A1Multi-user development system for system level device testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Application pending·0 cites
- 4346US2025283937A1System and method of adaptive auto tuning of thermal control system for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
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