Assignee
AEHR TEST SYSTEMS
US·74 granted patents·14 pending applications·842 citations·filing 1990–2025
Top patents by PatentIndex Score
88 records- 0198US11977098B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2023·Granted May 7, 2024·5 cites·22 claims
- 0298US11592465B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2021·Granted Feb 28, 2023·13 cites·11 claims
- 0398US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0498US11112429B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2019·Granted Sep 7, 2021·18 cites·8 claims
- 0598US10401385B2Limiting translation for consistent substrate-to-substrate contactAEHR TEST SYSTEMS·Filed 2017·Granted Sep 3, 2019·20 cites·20 claims
- 0698US9625521B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2014·Granted Apr 18, 2017·23 cites·5 claims
- 0797US12007451B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Jun 11, 2024·2 cites·15 claims
- 0897US9880197B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2017·Granted Jan 30, 2018·21 cites·10 claims
- 0997US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 1097US8030957B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2009·Granted Oct 4, 2011·42 cites·14 claims
- 1196US12292484B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted May 6, 2025·1 cites·20 claims
- 1296US11448695B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2020·Granted Sep 20, 2022·3 cites·35 claims
- 1396US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 1495US11835575B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Dec 5, 2023·11 cites·26 claims
- 1595US7826995B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Nov 2, 2010·38 cites·14 claims
- 1694US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 1793US7969175B2Separate test electronics and blower modules in an apparatus for testing an integrated circuitAEHR TEST SYSTEMS·Filed 2009·Granted Jun 28, 2011·27 cites·81 claims
- 1893US6580283B1Wafer level burn-in and test methodsAEHR TEST SYSTEMS·Filed 1999·Granted Jun 17, 2003·109 cites·35 claims
- 1992US2025085337A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2092US2025085338A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2191US6853209B1Contactor assembly for testing electrical circuitsAEHR TEST SYSTEMS·Filed 2002·Granted Feb 8, 2005·42 cites·14 claims
- 2291US2024393387A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2391US2024402243A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2491US2025093398A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2591US2025093399A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2691US2024393388A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2791US2024410938A1System for testing an integrated circuit of a device and itsmethod of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2890US12265136B2Method and system for thermal control of devices in electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 1, 2025·0 cites·9 claims
- 2990US6867608B2Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test componentAEHR TEST SYSTEMS·Filed 2002·Granted Mar 15, 2005·32 cites·13 claims
- 3089US12298328B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2024·Granted May 13, 2025·0 cites·16 claims
- 3189US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 3288US12169217B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Dec 17, 2024·0 cites·10 claims
- 3388US2024302451A1Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3487US5682472AMethod and system for testing memory programming devicesAEHR TEST SYSTEMS·Filed 1995·Granted Oct 28, 1997·84 cites·50 claims
- 3586US5093984APrinted circuit board loader/unloaderAEHR TEST SYSTEMS·Filed 1990·Granted Mar 10, 1992·57 cites·28 claims
- 3686US2025138086A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3785US12282062B2Electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 22, 2025·0 cites·30 claims
- 3885US12253560B2Electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Mar 18, 2025·0 cites·25 claims
- 3985US11821940B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Nov 21, 2023·0 cites·9 claims
- 4084US2025224423A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 4183US12326472B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2022·Granted Jun 10, 2025·0 cites·12 claims
- 4283US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 4382US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 4482US7053644B1System for testing and burning in of integrated circuitsAEHR TEST SYSTEMS·Filed 2004·Granted May 30, 2006·34 cites·26 claims
- 4581US12228609B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Feb 18, 2025·0 cites·45 claims
- 4681US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 4780US11635459B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 4880US10649022B2Electronics testerAEHR TEST SYSTEMS·Filed 2018·Granted May 12, 2020·1 cites·13 claims
- 4979US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 5079US2025208202A1Electronics testerAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
Showing the top 50 of 88 patent records by PatentIndex Score.
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