Assignee
AEHR TEST SYSTEMS INC
US·5 granted patents·379 citations·filing 1993–1999
Top patents by PatentIndex Score
5 records- 0198US6340895B1Wafer-level burn-in and test cartridgeAEHR TEST SYSTEMS INC·Filed 1999·Granted Jan 22, 2002·211 cites·44 claims
- 0284US5517125AReusable die carrier for burn-in and burn-in processAEHR TEST SYSTEMS INC·Filed 1993·Granted May 14, 1996·70 cites·25 claims
- 0371US6025732AReusable die carrier for burn-in and burn-in processAEHR TEST SYSTEMS INC·Filed 1997·Granted Feb 15, 2000·41 cites·63 claims
- 0469US5429510AHigh-density interconnect techniqueAEHR TEST SYSTEMS INC·Filed 1993·Granted Jul 4, 1995·34 cites·12 claims
- 0558US6292415B1Enhancements in testing devices on burn-in boardsAEHR TEST SYSTEMS INC·Filed 1999·Granted Sep 18, 2001·23 cites·20 claims
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