Assignee
AGERSONN RALL GROUP LLC
US·4 granted patents·78 citations·filing 2007–2010
Top patents by PatentIndex Score
4 records- 0198US7953573B2Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2010·Granted May 31, 2011·27 cites·31 claims
- 0295US8049145B1Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2007·Granted Nov 1, 2011·24 cites·13 claims
- 0392US8005641B2Temperature sensing circuit with hysteresis and time delayAGERSONN RALL GROUP LLC·Filed 2009·Granted Aug 23, 2011·15 cites·16 claims
- 0490US8040742B2Semiconductor device having variable parameter selection based on temperature and test methodAGERSONN RALL GROUP LLC·Filed 2009·Granted Oct 18, 2011·12 cites·21 claims
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