Assignee
AHBEE 1 L P
US·9 granted patents·83 citations·filing 2000–2009
Top patents by PatentIndex Score
9 records- 0189US7642772B1Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafersAHBEE 1 L P·Filed 2007·Granted Jan 5, 2010·14 cites·8 claims
- 0275US6567541B1Method and apparatus for adhesion testing of thin film materialsAHBEE 1 L P·Filed 2000·Granted May 20, 2003·11 cites·22 claims
- 0373USD601087SSolar cell arrayAHBEE 1 L P·Filed 2008·Granted Sep 29, 2009·20 cites·1 claims
- 0470US7362088B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2003·Granted Apr 22, 2008·9 cites·11 claims
- 0569US7737680B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·3 cites·3 claims
- 0664USD590768SSolar cellAHBEE 1 L P·Filed 2008·Granted Apr 21, 2009·14 cites·1 claims
- 0762US7741833B1Non contact method and apparatus for measurement of sheet resistance of p-n junctionsAHBEE 1 L P·Filed 2006·Granted Jun 22, 2010·2 cites·1 claims
- 0859US7502121B1Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materialsAHBEE 1 L P·Filed 2004·Granted Mar 10, 2009·9 cites·4 claims
- 0957US7737681B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·1 cites·5 claims
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