Assignee
AHN SUNG MIN
KR·7 granted patents·4 pending applications·14 citations·filing 2005–2016
Top patents by PatentIndex Score
11 records- 0185US8836943B2Workpiece alignment deviceAHN SUNG MIN·Filed 2011·Granted Sep 16, 2014·5 cites·18 claims
- 0277US8675180B2Maskless exposure apparatus and method of alignment for overlay in maskless exposureAHN SUNG MIN·Filed 2011·Granted Mar 18, 2014·4 cites·15 claims
- 0367US8964173B2Maskless exposure apparatus and spot beam position measurement method using the sameAHN SUNG MIN·Filed 2012·Granted Feb 24, 2015·3 cites·20 claims
- 0465US10263035B2Magnetoresistive random access memory devices and methods of manufacturing the sameAHN SUNG MIN·Filed 2016·Granted Apr 16, 2019·1 cites·20 claims
- 0552US8789203B2Method for providing data to a personal portable device via network and a system thereofAHN SUNG MIN·Filed 2005·Granted Jul 22, 2014·1 cites·8 claims
- 0651US2009152530A1Image sensor including photoelectric charge-trap structureAHN SUNG-MIN·Filed 2008·Application pending·0 cites
- 0740US8755034B2Maskless exposure apparatus and method to determine exposure start position and orientation in maskless lithographyAHN SUNG MIN·Filed 2011·Granted Jun 17, 2014·0 cites·12 claims
- 0837US2012038307A1Measurement System Using Alignment Unit And Method Of Determining System Parameters Of Alignment UnitAHN SUNG MIN·Filed 2011·Application pending·0 cites
- 0936US9052599B2Maskless exposure apparatus and methodAHN SUNG MIN·Filed 2010·Granted Jun 9, 2015·0 cites·18 claims
- 1036US2012038899A1Exposure apparatus and alignment error compensation method using the sameAHN SUNG MIN·Filed 2011·Application pending·0 cites
- 1136US2012038936A1Measurement System Using Alignment Unit And Position Measuring MethodAHN SUNG MIN·Filed 2011·Application pending·0 cites
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