Assignee

AIKAWA TETSURO

JP·2 granted patents·15 citations·filing 2008–2008

Technology mixG01B1 G01C1 G01N1 G06T1 G21C1 G21F1

Top patents by PatentIndex Score

2 records

0171US8483444B2Apparatus for inspecting and measuring object to be measuredAIKAWA TETSURO·Filed 2008·Granted Jul 9, 2013·9 cites·11 claims
0270US8976242B2Visual inspection apparatus and visual inspection methodAIKAWA TETSURO·Filed 2008·Granted Mar 10, 2015·6 cites·6 claims

Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →