Assignee

AIKO KENJI

JP·2 granted patents·21 citations·filing 2010–2012

Technology mixG01N2 G01B1 H01M1 H04N1 H10P1 Y02E1

Top patents by PatentIndex Score

2 records

0193US8319960B2Defect inspection systemAIKO KENJI·Filed 2010·Granted Nov 27, 2012·19 cites·12 claims
0277US9164042B2Device for detecting foreign matter and method for detecting foreign matterAIKO KENJI·Filed 2012·Granted Oct 20, 2015·2 cites·21 claims

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