Assignee
AKITA TOKUNORI
JP·3 granted patents·3 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0155US8756465B2Test module and a test method for reading a number of fails for a device under test (DUT)AKITA TOKUNORI·Filed 2011·Granted Jun 17, 2014·3 cites·14 claims
- 0236US8433964B2Test apparatus and test methodAKITA TOKUNORI·Filed 2011·Granted Apr 30, 2013·0 cites·18 claims
- 0332US8949062B2Test module, test apparatus, and test methodAKITA TOKUNORI·Filed 2010·Granted Feb 3, 2015·0 cites·6 claims
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