Assignee
AMANULLAH AJHARALI
SG·5 granted patents·1 pending application·18 citations·filing 2007–2013
Top patents by PatentIndex Score
6 records- 0179US8885918B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Nov 11, 2014·9 cites·22 claims
- 0273US9863889B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Jan 9, 2018·4 cites·25 claims
- 0371US9746426B2System and method for capturing illumination reflected in multiple directionsAMANULLAH AJHARALI·Filed 2011·Granted Aug 29, 2017·2 cites·22 claims
- 0459US10161881B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Dec 25, 2018·1 cites·28 claims
- 0559US8401272B2Patterned wafer defect inspection system and methodAMANULLAH AJHARALI·Filed 2007·Granted Mar 19, 2013·2 cites·21 claims
- 0649US2015233840A1System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2013·Application pending·0 cites
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