Assignee

AMIR NURIEL

IL·1 granted patent·1 pending application·31 citations·filing 2006–2013

Technology mixG03F1 H01L1 H10B1 H10P1 H10W1

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2 records

0192US9093458B2Device correlated metrology (DCM) for OVL with embedded SEM structure overlay targetsAMIR NURIEL·Filed 2013·Granted Jul 28, 2015·31 cites·20 claims
0237US2007235776A1Forming memory arraysAMIR NURIEL·Filed 2006·Application pending·0 cites

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